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For the Inventor, By the Inventor

Portland, OR, United States of America

James B McGinn

This inventor holds 13 USPTO granted patents and 3 published patent applications and 3 EPO patents, primarily in Ion Source Technology. Top assignees: Fei Comapny, Other. Active years: 2002-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James B McGinn. Retrieved from https://idiyas.com/inventor/james-b-mcginn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 13 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.2

ph-index = 4

Forward Citations = 54(Granted Patents)


Location History:

  • Portland, OR (US) (2002 - 2017)
  • Hillsboro, OR (US) (2006 - 2023)

Company Filing History:

goldMedal11 out of 865 
 
Fei Comapny
 patents
silverMedal2 out of 834,708 
Other
 patents

Years Active: 2002-2025

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Areas of Expertise:
Beam Displacement
Liquid Metal Ion Source
Charged Particle Microscope
High Voltage Isolation
Magnetic Field Control
Retarding Field Analyzer
Electron Detector
Schottky Emitter
Sputter Shields
Anode Element
Particle Beam Column
13 patents (USPTO):Explore Patents
1. 12411099 - Systems and methods for detecting beam displacement (2025-09-09),
2. 12237142 - Methods for determining the virtual source location of a liquid metal ion source (2025-02-25),
3. 11651928 - Reentrant gas system for charged particle microscope (2023-05-16),
4. 9591735 - High voltage isolation of an inductively coupled plasma ion source with a liquid that is not actively pumped (2017-03-07),
5. 8835866 - Method and structure for controlling magnetic field distributions in an ExB Wien filter (2014-09-16),
6. 8803102 - Retarding field analyzer integral with particle beam column (2014-08-12),
7. 8642974 - Encapsulation of electrodes in solid media for use in conjunction with fluid high voltage isolation (2014-02-04),
8. 8164059 - In-chamber electron detector (2012-04-24),
9. 7064477 - Low power schottky emitter (2006-06-20),
10. 6977384 - Shaped sputter shields for improved ion column operation (2005-12-20),
11. 6771013 - Low power schottky emitter (2004-08-03),
12. 6680562 - Schottky emitter having extended life (2004-01-20),
13. 6388385 - Corrugated style anode element for ion pumps (2002-05-14),

Title: Innovations of James B McGinn

Introduction

James B McGinn is a notable inventor based in Portland, OR (US), recognized for his contributions to the field of beam microscopy systems. With a total of 13 patents to his name, McGinn has made significant advancements in detecting beam displacement and improving the functionality of charged particle beam systems.

Latest Patents

Among his latest patents, McGinn has developed systems and methods for detecting beam displacement. These innovations include detectors designed to identify lateral beam displacement for beam microscopy systems. One aspect of this invention features a detector with an aperture that allows a charged particle beam to pass through and irradiate a sample. Additionally, a plurality of rails extends radially outward from the aperture, each configured to detect charged particles from the beam before they interact with the sample. Another significant patent involves methods for determining the virtual source location of a liquid metal ion source. This method determines variations in charged-particle-beam source location by scanning an alignment aperture fixed with respect to a beam defining aperture in a charged particle beam. The alignment aperture transmits a portion of the beam to a secondary emission surface, producing secondary emissions directed to a scintillator element.

Career Highlights

Throughout his career, McGinn has worked with various companies, including the renowned FEI Company. His work has focused on enhancing the capabilities of charged particle beam systems, contributing to advancements in microscopy and imaging technologies.

Collaborations

Some of McGinn's notable coworkers include Gregory A Schwind and David S Jun, who have collaborated with him on various projects and innovations.

Conclusion

James B McGinn's contributions to the field of beam microscopy and charged particle beam systems have established him as a prominent inventor. His innovative patents and collaborations reflect his commitment to advancing technology in this specialized area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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