Portland, OR, United States of America

James B McGinn

USPTO Granted Patents = 13 

 

Average Co-Inventor Count = 2.2

ph-index = 4

Forward Citations = 52(Granted Patents)


Location History:

  • Portland, OR (US) (2002 - 2017)
  • Hillsboro, OR (US) (2006 - 2023)

Company Filing History:


Years Active: 2002-2025

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13 patents (USPTO):Explore Patents

Title: Innovations of James B McGinn

Introduction

James B McGinn is a notable inventor based in Portland, OR (US), recognized for his contributions to the field of beam microscopy systems. With a total of 13 patents to his name, McGinn has made significant advancements in detecting beam displacement and improving the functionality of charged particle beam systems.

Latest Patents

Among his latest patents, McGinn has developed systems and methods for detecting beam displacement. These innovations include detectors designed to identify lateral beam displacement for beam microscopy systems. One aspect of this invention features a detector with an aperture that allows a charged particle beam to pass through and irradiate a sample. Additionally, a plurality of rails extends radially outward from the aperture, each configured to detect charged particles from the beam before they interact with the sample. Another significant patent involves methods for determining the virtual source location of a liquid metal ion source. This method determines variations in charged-particle-beam source location by scanning an alignment aperture fixed with respect to a beam defining aperture in a charged particle beam. The alignment aperture transmits a portion of the beam to a secondary emission surface, producing secondary emissions directed to a scintillator element.

Career Highlights

Throughout his career, McGinn has worked with various companies, including the renowned FEI Company. His work has focused on enhancing the capabilities of charged particle beam systems, contributing to advancements in microscopy and imaging technologies.

Collaborations

Some of McGinn's notable coworkers include Gregory A Schwind and David S Jun, who have collaborated with him on various projects and innovations.

Conclusion

James B McGinn's contributions to the field of beam microscopy and charged particle beam systems have established him as a prominent inventor. His innovative patents and collaborations reflect his commitment to advancing technology in this specialized area.

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