Williston, VT, United States of America

James Allan Bruce

This inventor holds 28 USPTO granted patents, primarily in Optical Proximity Correction. Top assignee: International Business Machines Corporation. Active years: 1986-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Allan Bruce. Retrieved from https://idiyas.com/inventor/james-allan-bruce

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 50.0

Average Co-Inventor Count = 3.6

ph-index = 9

Forward Citations = 248(Granted Patents)


Location History:

  • Underhill, VT (US) (1986)
  • Essex Junction, VT (US) (1990 - 2012)
  • Williston, VT (US) (1996 - 2013)

Company Filing History:


Years Active: 1986-2013

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Areas of Expertise:
Optical Proximity Correction
Lithographic Set Point
Mask Defect Analysis
Design Verification
Etch Bias Proximity Correction
Semiconductor Fabrication
Electrical Test Structure
Photomask Design
Alignment Target Visibility
Plasma Etch Fluting
Doping Process
Photochromic Filter
28 patents (USPTO):Explore Patents

Title: The Inventor James Allan Bruce: Pioneering Innovations in Williston

Introduction: James Allan Bruce is a distinguished inventor based in Williston, VT, known for his groundbreaking contributions to various fields.

Latest Patents: James Allan Bruce holds several patents in the areas of renewable energy technologies, medical devices, and consumer electronics.

Career Highlights: With a career spanning over two decades, James Allan Bruce has been at the forefront of innovation, leading research and development teams in creating cutting-edge solutions.

Collaborations: Throughout his career, James Allan Bruce has collaborated with top research institutions, universities, and leading companies to bring his inventions to life.

Conclusion: James Allan Bruce's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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