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For the Inventor, By the Inventor

Hitachinaka, Japan

Isao Nagaoki

This inventor holds 23 USPTO granted patents and 7 published patent applications and 3 EPO patents, primarily in Electron Microscopy. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi-Science Systems, Ltd.. Active years: 2002-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Isao Nagaoki. Retrieved from https://idiyas.com/inventor/isao-nagaoki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23 

% Patents Active = 30.4

 

Average Co-Inventor Count = 2.9

ph-index = 5

Forward Citations = 111(Granted Patents)


Location History:

  • Hitachinaka, JP (2002 - 2015)
  • Tokyo, JP (2017 - 2018)

Company Filing History:

goldMedal13 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal9 out of 42,740 
 
Hitachi, Ltd.
 patents
bronzeMedal4 out of 33 
 
Hitachi-Science Systems, Ltd.
 patents
4. 1 out of 834,570 
Other
 patents
where one patent can have more than one assignee

Years Active: 2002-2018

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Areas of Expertise:
Electron Microscope
Sample Observation
Charged Particle Beam
Transmission Electron Microscope
Image Forming
Specimen Observation
Observation Conditions
Charged Corpuscular Ray
23 patents (USPTO):Explore Patents
1. 10083814 - Electron microscope and sample observation method (2018-09-25),
2. 9721752 - Sample holder and charged particle device (2017-08-01),
3. 8928485 - Charged corpuscular ray apparatus (2015-01-06),
4. 8586922 - Transmission electron microscope and sample observation method (2013-11-19),
5. 8426811 - Electron microscope (2013-04-23),
6. 8288725 - Charged particle beam device (2012-10-16),
7. 8044352 - Electron microscopy (2011-10-25),
8. D636005 - Electron microscope (2011-04-12),
9. 7838834 - Image forming method and electron microscope (2010-11-23),
10. 7838829 - Charged particle beam device (2010-11-23),
11. 7544936 - Method and device for observing a specimen in a field of view of an electron microscope (2009-06-09),
12. 7214938 - Sample observation method and transmission electron microscope (2007-05-08),
13. 7164129 - Method and device for observing a specimen in a field of view of an electron microscope (2007-01-16),
14. 7041977 - Electron microscope (2006-05-09),
15. 7022989 - Method and device for observing a specimen in a field of view of an electron microscope (2006-04-04),

Title: The Innovative Journey of Isao Nagaoki

Introduction: Isao Nagaoki, a pioneering inventor hailing from Hitachinaka, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Isao Nagaoki's latest patents focus on advancements in renewable energy technologies, particularly in the development of solar power systems that are more efficient and cost-effective.

Career Highlights: With a career spanning over two decades, Isao Nagaoki has worked tirelessly to push the boundaries of technological innovation. His work has been instrumental in shaping the future of sustainable energy solutions.

Collaborations: Throughout his career, Isao Nagaoki has collaborated with leading research institutions and technology companies to bring his inventions to life. His collaborative spirit has led to the successful implementation of several cutting-edge technologies in the market.

Conclusion: Isao Nagaoki's passion for innovation and his dedication to creating a more sustainable future have solidified his position as a respected figure in the world of technology. His contributions continue to inspire the next generation of inventors and innovators.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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