Higashiyamanashi-gun, Japan

Isao Kono


Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 20(Granted Patents)


Location History:

  • Yamanashi-ken, JP (1999 - 2001)
  • Higashiyamanashi-gun, JP (2001 - 2002)

Company Filing History:


Years Active: 1999-2002

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5 patents (USPTO):Explore Patents

Title: Innovative Contributions of Isao Kono: Advancements in Probing Technology

Introduction

Isao Kono is a prominent inventor based in Higashiyamanashi-gun, Japan, recognized for his significant contributions in the field of electrical inspection technologies. With a total of five patents to his name, Kono has made remarkable strides that improve the precision and efficiency of probing methods used in semiconductor manufacturing.

Latest Patents

Among his latest inventions is a probing method and system designed for inspecting the electrical characteristics of various objects. This innovative approach allows for efficient contact between electrode pads mounted on a main chuck and probes of a probe card. The method employs coordinated movements across X, Y, and Z axes, ensuring that each electrode pad is accurately probed. The simultaneous overdriving of the chuck is a notable feature, enhancing the reliability and accuracy of the inspections.

Another recent patent introduced by Kono is an aligner apparatus which includes a wafer chuck, wafer, and contactor that are precisely aligned to form a coherent shell. This shell can then be disassembled while retaining crucial positional data through an identification code, allowing for optimized movement of the main chuck based on accurate retrieval from the control device.

Career Highlights

Isao Kono is currently associated with Tokyo Electron Limited, a leading company in the semiconductor industry. His role has involved pioneering new methods that increase the efficiency of electronic testing processes, thereby benefiting a wide array of applications in technology and electronics.

Collaborations

Throughout his career, Kono has worked alongside esteemed colleagues, including Yutaka Akaike and Satoshi Sano. Their collaborations have further pushed the boundaries of innovation within the field, leading to advancements that ensure higher quality control across semiconductor manufacturing processes.

Conclusion

In conclusion, Isao Kono stands out as a key figure in the realm of electrical probing technology. His inventive methodologies and systems, showcased through his patents, mark significant contributions to the efficiency and reliability of electrical inspections in the semiconductor industry. As technology continues to evolve, Kono's work will undoubtedly play a pivotal role in shaping the future of electronic manufacturing.

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