Igor Ziselman

Title: Igor Ziselman: Innovator in Metrology Methods

Introduction

Igor Ziselman is a prominent inventor based in Modi'in-Maccabim-Re'ut, Israel. He has made significant contributions to the field of metrology, particularly through his innovative methods for analyzing three-dimensional patterned structures. With a total of 4 patents to his name, Ziselman continues to push the boundaries of technology and measurement.

Latest Patents

Ziselman's latest patents include a TEM-based metrology method and system. This method is designed to determine one or more parameters of a three-dimensional patterned structure. It involves performing a fitting procedure between measured Transmission Electron Microscopy (TEM) image data and simulated TEM image data. The process allows for the determination of a measured Lamellae position from a best fit condition, ultimately generating output data that indicates the simulated TEM image data corresponding to the best fit condition. Another notable patent is a metrology method that utilizes raw measured TEM image data and predetermined simulated TEM image data. This method also includes a fitting procedure to determine parameters of the structure from the simulated TEM image data corresponding to a best fit condition.

Career Highlights

Throughout his career, Igor Ziselman has worked with notable companies, including Nova Corporation. His expertise in metrology has allowed him to develop advanced techniques that enhance the accuracy of measurements in various applications.

Collaborations

Ziselman has collaborated with several professionals in his field, including Vladimir Machavariani and Michael Shifrin. These collaborations have contributed to the development of innovative solutions in metrology.

Conclusion

Igor Ziselman's work in metrology has established him as a key figure in the field, with his patents reflecting his commitment to advancing measurement technologies. His contributions continue to influence the industry and inspire future innovations.