Mure, Japan

Ichiro Ishimaru


Average Co-Inventor Count = 8.0

ph-index = 4

Forward Citations = 35(Granted Patents)


Company Filing History:


Years Active: 2005-2017

where 'Filed Patents' based on already Granted Patents

6 patents (USPTO):

Title: Ichiro Ishimaru: Innovator in Surface Inspection Technology

Introduction

Ichiro Ishimaru is a prominent inventor based in Mure, Japan. He has made significant contributions to the field of surface inspection technology, holding a total of six patents. His work focuses on developing advanced apparatuses for defect inspection, which are crucial in various industrial applications.

Latest Patents

One of Ichiro Ishimaru's latest patents is a surface inspection apparatus and method designed to enhance defect detection on sample surfaces. This innovative apparatus includes a first illumination optical system that illuminates the inspection area from a normal line direction or a nearby direction. Additionally, it features a second illumination optical system that illuminates the area from a slant direction. The detection optical system comprises multiple first detectors strategically located around the inspection area. These detectors work together to analyze the regular reflected light component from the sample surface, enabling effective defect inspection based on signals obtained from the detectors.

Career Highlights

Ichiro Ishimaru has had a distinguished career, working with notable companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking innovations in surface inspection technology.

Collaborations

Throughout his career, Ichiro has collaborated with talented individuals, including Minori Noguchi and Ichiro Moriyama. These collaborations have fostered a creative environment that has led to the development of advanced inspection technologies.

Conclusion

Ichiro Ishimaru's contributions to surface inspection technology have made a significant impact in the industry. His innovative patents and collaborative efforts highlight his dedication to advancing defect inspection methods. His work continues to influence the field and inspire future innovations.

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