Company Filing History:
Years Active: 2015-2025
Title: Hyug-gyo Rhee: Innovator in Multilayer Thin Film Measurement Technologies
Introduction
Hyug-gyo Rhee is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of optical measurement technologies, particularly in the area of multilayer thin films. With a total of 10 patents to his name, Rhee's work has advanced the capabilities of measuring thickness and refractive indices in complex materials.
Latest Patents
Rhee's latest patents include innovative methods and devices for measuring multilayer thin films. One notable patent is for a "Vibration insensitive interferometry for measuring thickness and profile of multilayer thin-film." This invention provides an apparatus and method that allows for precise measurement of the phase of a measurement object by acquiring multiple phase-shifted interference signal images simultaneously. The technology utilizes a polarizing beam splitter, a quarter-wave plate, a shutter, and a pixelated polarizing camera to achieve its results.
Another significant patent is the "Device and method for measuring thickness and refractive index of multilayer thin film by using angle-resolved spectral reflectometry." This invention enables the measurement of thickness and refractive index by analyzing angle-resolved spectral reflectance according to light polarization. The method is capable of measuring and analyzing each layer of a multilayer structure through s-polarized and p-polarized imaging.
Career Highlights
Hyug-gyo Rhee is affiliated with the Korea Research Institute of Standards and Science, where he continues to develop and refine his innovative technologies. His work has been instrumental in enhancing the accuracy and efficiency of optical measurements in various applications.
Collaborations
Rhee has collaborated with notable colleagues, including Young-sik Ghim and Yun Woo Lee, contributing to the advancement of research in optical measurement technologies.
Conclusion
Hyug-gyo Rhee's contributions to the field of multilayer thin film measurement technologies have established him as a leading inventor in his domain. His innovative patents reflect a commitment to advancing measurement techniques, which have significant implications for various scientific and industrial applications.