Eden Prairie, MN, United States of America

Huiwen Liu

USPTO Granted Patents = 10 

Average Co-Inventor Count = 3.7

ph-index = 4

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2008-2018

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10 patents (USPTO):Explore Patents

Title: Innovations of Huiwen Liu

Introduction

Huiwen Liu is a notable inventor based in Eden Prairie, MN (US). She has made significant contributions to the field of microscopy and spectroscopy, holding a total of 10 patents. Her work focuses on enhancing the accuracy and precision of scientific measurements, which has broad implications in various research areas.

Latest Patents

Huiwen Liu's latest patents include innovative technologies in atomic force microscopy and Raman spectroscopy. One of her patents describes an apparatus and method for atomic force microscopy that involves performing multiple scans of a sample to produce corrected images. This method enhances the quality of imaging by correcting errors based on comparative scans. Another patent focuses on improving accuracy and precision in Raman spectroscopy. This invention includes a device that adjusts the focus of the Raman spectroscopic apparatus to optimize the intensity of Raman scattering, thereby enhancing the measurement of sample properties.

Career Highlights

Huiwen Liu is currently employed at Seagate Technology Incorporated, where she applies her expertise in developing advanced imaging and spectroscopic techniques. Her work has been instrumental in pushing the boundaries of what is possible in scientific research and technology.

Collaborations

Huiwen collaborates with talented individuals such as Lin Zhou and Dale E. Egbert, contributing to a dynamic research environment that fosters innovation and discovery.

Conclusion

Huiwen Liu's contributions to atomic force microscopy and Raman spectroscopy exemplify her commitment to advancing scientific knowledge through innovation. Her patents reflect a deep understanding of complex scientific principles and a dedication to improving measurement techniques.

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