The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2013
Filed:
Aug. 10, 2010
Lin Zhou, Eagan, MN (US);
Huiwen Liu, Eden Prairie, MN (US);
Dale Egbert, Deephaven, MN (US);
Peter Gunderson, Ellsworth, WI (US);
John Ibele, Minneapolis, MN (US);
Cing Siong Ling, Bayan Lepas, MY;
Lin Zhou, Eagan, MN (US);
Huiwen Liu, Eden Prairie, MN (US);
Dale Egbert, Deephaven, MN (US);
Peter Gunderson, Ellsworth, WI (US);
John Ibele, Minneapolis, MN (US);
Kah Choong Loo, Bayan Lepas, MY;
Cing Siong Ling, Bayan Lepas, MY;
Seagate Technology LLC, Cupertino, CA (US);
Abstract
An apparatus and associated method for topographically characterizing a workpiece. A scanning probe obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file and to scan a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest.