This inventor holds 1 USPTO granted patent. Top assignee: Seagate Technology Incorporated. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Innovations of Cing Siong Ling in Scanning Probe Microscopy
Introduction
Cing Siong Ling is a notable inventor based in Bayan Lepas, Malaysia. He has made significant contributions to the field of microscopy, particularly through his innovative patent in scanning probe technology. His work has implications for various applications in material science and engineering.
Latest Patents
Cing Siong Ling holds a patent titled "Scanning probe microscopy employing correlation pattern recognition." This invention describes an apparatus and associated method for topographically characterizing a workpiece. The technology involves a scanning probe that obtains topographical data from the workpiece. A processor controls the scanning probe to scan a reference surface of the workpiece to derive a first digital file. It also scans a surface of interest that includes at least a portion of the reference surface to derive a second digital file. Correlation pattern recognition logic integrates the first and second digital files together to align the reference surface with the surface of interest. This innovative approach enhances the accuracy and efficiency of topographical analysis.
Career Highlights
Cing Siong Ling is currently employed at Seagate Technology Incorporated, where he continues to develop and refine his inventions. His work at Seagate has allowed him to collaborate with other talented professionals in the field, contributing to advancements in technology.
Collaborations
Some of his notable coworkers include Dale E Egbert and Kah Choong Loo. Their collaboration has fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Cing Siong Ling's contributions to scanning probe microscopy exemplify the impact of innovative thinking in technology. His patent demonstrates a significant advancement in the field, showcasing the importance of collaboration and creativity in driving progress.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
