The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2017
Filed:
Jul. 26, 2012
Applicants:
Huiwen Liu, Eden Prairie, MN (US);
Peter Gunderson, Ellsworth, WI (US);
Inventors:
Huiwen Liu, Eden Prairie, MN (US);
Peter Gunderson, Ellsworth, WI (US);
Assignee:
SEAGATE TECHNOLOGY LLC, Cupertino, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/04 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
B82Y 35/00 (2013.01); G01Q 30/04 (2013.01);
Abstract
A semi-automated method for atomic force microscopy ('AFM') scanning of a sample is disclosed. The method can include manually teaching a sample and AFM tip relative location on an AFM tool; then scanning, via a predefined program, on the same sample or other sample with same pattern to produce more images automatically.