Honglei Ji

Title: **Innovative Contributions of Honglei Ji in Mass Measurement Technology**

Introduction

Honglei Ji is a distinguished inventor based in Beijing, China, recognized for his significant contributions in the field of precision measurement technologies. With a total of 2 patents to his name, he has developed advanced solutions that cater to the needs of various industries requiring high accuracy in mass measurement.

Latest Patents

Honglei Ji's recent inventions include two groundbreaking patents centered around high accuracy measuring devices for large masses. The first patent, titled "High Accuracy Measuring Device for Measuring Large Mass," introduces a sophisticated measuring device composed of a main frame and a main beam featuring a central knife and parallel side knives. It integrates a balancing system with counterweights and a weighting system for efficient mass measurement. Additionally, the device incorporates a weight transportation system and a control system capable of synchronizing the balancing and weighting systems, ensuring precision in measurements. Notably, the central knife and side knives utilize a high temperature-cryogenic cycling process, enhancing their capability and accuracy.

The second patent, "Measuring Device for Measuring Large Mass with Optical Refraction and Displacement Measuring," showcases the innovation further. This device employs a main frame, main beam, balancing system, and weighting system, similar to the first patent. However, it uniquely integrates an optical sensor and a laser displacement sensor to measure the actual displacement of the main beam precisely. The control system in this invention compares displacement data from both sensors, allowing for highly accurate measurements.

Career Highlights

Honglei Ji is affiliated with the National Institute of Metrology, where he has dedicated his career to advancing measurement technologies. His work not only emphasizes precision but also the importance of innovation in scientific measurement standards. This role within the institute allows him to impact national and international measurement practices significantly.

Collaborations

Throughout his career, Honglei Ji has collaborated with fellow researchers and inventors, such as Jian Wang and Changqing Cai. These partnerships reflect a commitment to fostering an environment of shared knowledge and expertise, driving forward the quest for groundbreaking innovations in metrology.

Conclusion

Honglei Ji’s innovations in mass measurement technology exemplify how dedicated inventors can develop practical solutions that enhance accuracy in various applications. His contributions through his patents and collaborations not only highlight his expertise but also signify the importance of ongoing research and development in metrology. As technologies continue to evolve, inventors like Ji play a crucial role in shaping the future landscape of measurement science.