National Institute of Metrology

Honglei Ji

Jian Wang

Tao Li

Ping Chen

Xiang Wang

Xiaolei Wang

Changqing Cai

Xiaoping Ren

Manhong Hu

The invention relates to a measuring device for measuring the mass of a weight, comprising a main frame, a main beam supported on the main frame and comprising a central knife and two side knives parallel with the central knife; a balancing system loaded on one end of the main beam and comprising a set of counterweights; a weighting system loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system. The central knife and the two side knives are made from metal with a high temperature-cryogenic cycling process. The central knife and the two side knives are configured to be adjusted in parallelism with a three-coordinates measuring machine. The control system is adapted to control the balancing system and the weighting system to synchronously load or unload the balancing system and the weighting system.

High accuracy measuring device for measuring large mass

The invention discloses a measuring device for measuring the mass of a weight, comprising: a main frame; a main beam supported on main frame; a balancing system loaded on one end of the main beam; a weighting system, loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system comprising an optical sensor mounted in the main frame, a laser displacement sensor mounted on the main beam, a monitor, and a control unit connected electrically to the optical sensor, the laser displacement sensor and the monitor. The control system is adapted to compare a main beam first displacement data obtained by the optical sensor and a main beam second displacement data obtained by the laser displacement sensor to accurately measure the actual displacement of the main beam.

Measuring device for measuring large mass with optical refraction and displacement measuring

Growing community of inventors

Beijing, China

Honglei Ji