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National Institute of Metrology

USPTO Granted Patents = 8

Forward Citations = 11

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30 inventors (with patents filed for the assignee):

Jian Wang (3 out of 677 patents)

Xiang Wang (3 out of 27 patents)

Changqing Cai (3 out of 3 patents)

4. Xiaoping Ren (3 out of 3 patents)

5. Manhong Hu (3 out of 3 patents)

6. Tao Li (2 out of 106 patents)

7. Ping Chen (2 out of 45 patents)

8. Xiaolei Wang (2 out of 13 patents)

9. Honglei Ji (2 out of 2 patents)

10. Ming Yang (1 out of 215 patents)

11. Hao Cheng (1 out of 26 patents)

12. Zheng Li (1 out of 55 patents)

13. Lei Yang (1 out of 33 patents)

14. Fei Liu (1 out of 148 patents)

15. Yang Bai (1 out of 66 patents)

8 patents: Sort by Forward Citations

1. 11835378 - Automatic large-mass-weight handling system (2023-12-05),

2. 11067596 - Method for calibrating phase-frequency characteristic of low frequence accelerometer based on time-spatial synchronization (2021-07-20),

3. 10907950 - Laser heterodyne interferometric apparatus and method based on plane mirror reflection (2021-02-02),

4. 10378950 - High accuracy measuring device for measuring large mass (2019-08-13),

5. 10274362 - Measuring device for measuring large mass with optical refraction and displacement measuring (2019-04-30),

6. 9347823 - Absolute measurement method and apparatus thereof for non-linear error (2016-05-24),

7. 9323158 - Method of extreme ultraviolet lithography projection objective (2016-04-26),

8. 7742244 - Cylindrical model eye, cylindrical test device and the manufacturing method thereof (2010-06-22),

The National Institute of Metrology, Quality and Technology (INMETRO) is the Brazilian regulatory body responsible for metrology, quality and conformity assessment. INMETRO works to ensure fair trade practices, consumer protection, and promote technological development through metrology standards and conformity evaluation programs.

This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 23 2025

8 Patents

#293 in Beijing

#3,050 in China

National Institute of Metrology

Forward Citations = 11

30 inventors:

Jian Wang (3 out of 677 patents)

Xiang Wang (3 out of 27 patents)

Changqing Cai (3 out of 3 patents)

4. Xiaoping Ren (3 out of 3 patents)

5. Manhong Hu (3 out of 3 patents)

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