The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Oct. 12, 2016
National Institute of Metrology, Beijing, CN;
Jian Wang, Beijing, CN;
Changqing Cai, Beijing, CN;
Xiaoping Ren, Beijing, CN;
Tao Li, Beijing, CN;
Manhong Hu, Beijing, CN;
Xiaolei Wang, Beijing, CN;
Honglei Ji, Beijing, CN;
Xiang Wang, Beijing, CN;
Ping Chen, Beijing, CN;
NATIONAL INSTITUTE OF METROLOGY, Beijing, CN;
Abstract
The invention relates to a measuring device for measuring the mass of a weight, comprising a main frame, a main beam supported on the main frame and comprising a central knife and two side knives parallel with the central knife; a balancing system loaded on one end of the main beam and comprising a set of counterweights; a weighting system loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system. The central knife and the two side knives are made from metal with a high temperature-cryogenic cycling process. The central knife and the two side knives are configured to be adjusted in parallelism with a three-coordinates measuring machine. The control system is adapted to control the balancing system and the weighting system to synchronously load or unload the balancing system and the weighting system.