The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

Oct. 12, 2016
Applicant:

National Institute of Metrology, Beijing, CN;

Inventors:

Jian Wang, Beijing, CN;

Changqing Cai, Beijing, CN;

Xiaoping Ren, Beijing, CN;

Tao Li, Beijing, CN;

Manhong Hu, Beijing, CN;

Xiaolei Wang, Beijing, CN;

Honglei Ji, Beijing, CN;

Xiang Wang, Beijing, CN;

Ping Chen, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01G 1/22 (2006.01); G01G 1/26 (2006.01); G01G 21/00 (2006.01); G01G 23/01 (2006.01); G01G 23/32 (2006.01); G01G 23/22 (2006.01);
U.S. Cl.
CPC ...
G01G 23/32 (2013.01); G01G 1/22 (2013.01); G01G 1/26 (2013.01); G01G 21/00 (2013.01); G01G 23/01 (2013.01);
Abstract

The invention discloses a measuring device for measuring the mass of a weight, comprising: a main frame; a main beam supported on main frame; a balancing system loaded on one end of the main beam; a weighting system, loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system comprising an optical sensor mounted in the main frame, a laser displacement sensor mounted on the main beam, a monitor, and a control unit connected electrically to the optical sensor, the laser displacement sensor and the monitor. The control system is adapted to compare a main beam first displacement data obtained by the optical sensor and a main beam second displacement data obtained by the laser displacement sensor to accurately measure the actual displacement of the main beam.


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