This inventor holds 47 USPTO granted patents and 8 published patent applications, primarily in Image Processing. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation, Sanyo Electric Co., Ltd.. Active years: 2008-2026.
Location History:
- Hitachinaka, JP (2010 - 2015)
- Chiyoda-ku, JP (2018 - 2021)
- Tokyo, JP (2008 - 2024)
Company Filing History:
16 out of 2,874Â 
14 out of 1,380Â 
13 out of 8,782Â 
Years Active: 2008-2026
Areas of Expertise:
Title: Innovations of Hiroyuki Shindo: Pioneering Defect Inspection Technology
Introduction
Hiroyuki Shindo is an accomplished inventor based in Tokyo, Japan, known for his significant contributions to the field of defect inspection technology. With an impressive portfolio of 43 patents, he has been at the forefront of innovations aimed at improving image synthesis and inspection methodologies.
Latest Patents
Among his latest inventions, Shindo has developed a defect inspection apparatus that utilizes images of different synthesis ratios. This technology provides a method for inspecting various types of defects within synthesized images. The apparatus synthesizes detection signals from two different detectors at varying synthesis ratios to generate multiple inspection images. Following this, it executes a logical operation between these images to produce a synthesized inspection image that facilitates defect determination. Additionally, Shindo has created an inspection apparatus with an image distortion estimation unit capable of correcting distortion between reference and inspection images. This ensures that only the distortion occurring throughout the entire image can be effectively corrected.
Career Highlights
Hiroyuki Shindo has established his career with notable positions at prominent companies. He has worked with Hitachi High-Technologies Corporation and Sanyo Electric Co., Ltd., where he contributed invaluable expertise in advancements related to imaging and inspection technologies. His innovative spirit and technical acumen have earned him recognition in the industry.
Collaborations
Throughout his career, Shindo has had the privilege of collaborating with talented individuals such as Yasutaka Toyoda and Ryoichi Kawasaki. Their teamwork has fueled innovation and fostered developments in advanced defect inspection systems, further enhancing their shared technological endeavors.
Conclusion
Hiroyuki Shindo's contributions to the field of defect inspection technology exemplify his dedication to innovation. With 43 patents to his name and ongoing advancements in his work, Shindo continues to make a significant impact in imaging technologies, paving the way for future developments in the industry. His ongoing research and collaborative efforts signify a promising trajectory for advancements in defect detection and image synthesis methodology.