The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

May. 25, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Ryugo Kagetani, Tokyo, JP;

Kaoru Fukaya, Tokyo, JP;

Hiroyuki Shindo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/04 (2006.01); G01N 23/2251 (2018.01);
U.S. Cl.
CPC ...
G01B 15/04 (2013.01); G01N 23/2251 (2013.01); G01N 2223/6116 (2013.01);
Abstract

An object of the disclosure is to provide a pattern inspection and measurement apparatus that can accurately specify a corner point formed on a sample. The pattern inspection and measurement apparatus according to the disclosure specifies a pair of corner points as a corner pair candidate on design data, and specifies a corner point on an actually formed shape pattern in accordance with a relative relation between the corner pair candidate on the design data and the corner pair candidate in the shape pattern (see FIG.).


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