Company Filing History:
Years Active: 2022-2025
Title: Innovations of Ryugo Kagetani
Introduction
Ryugo Kagetani is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of defect inspection and pattern height information correction. With a total of two patents to his name, Kagetani's work is recognized for its innovative approaches to complex technical challenges.
Latest Patents
Kagetani's latest patents include a defect inspection apparatus and method that utilizes synthesized images to identify various types of defects. This apparatus synthesizes detection signals from multiple detectors to create inspection images, which are then analyzed to determine defects. His second patent focuses on a pattern height information correction system that employs contour line information extracted from images, particularly using atomic force microscopy. This system enhances the accuracy of height information by creating approximated curved surfaces based on specified regions of the extracted patterns.
Career Highlights
Kagetani is currently employed at Hitachi High-Tech Corporation, where he continues to develop innovative solutions in his field. His work has contributed to advancements in defect inspection technologies, which are crucial for various applications in manufacturing and quality control.
Collaborations
Kagetani collaborates with esteemed colleagues such as Hiroyuki Shindo and Yasushi Ebizuka. Their combined expertise fosters a productive environment for innovation and development within their projects.
Conclusion
Ryugo Kagetani's contributions to the field of defect inspection and pattern height information correction highlight his role as a leading inventor in Japan. His innovative patents reflect a commitment to advancing technology and improving industrial processes.