The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Aug. 21, 2018
Konica Minolta, Inc., Chiyoda-ku, JP;
Ryouta Ishikawa, Chiyoda-ku, JP;
Hiroyuki Matsuda, Chiyoda-ku, JP;
Masashi Kageyama, Chiyoda-ku, JP;
Junichiro Yonetake, Chiyoda-ku, JP;
Hideyuki Fujii, Chiyoda-ku, JP;
Hiroyuki Shindo, Chiyoda-ku, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
Scanning optical system, comprising a rotatable mirror unit including first and second mirror surfaces each inclining relative to a rotation axis, and a light projecting system including a light source which emits light flux toward an object through the mirror unit. The light flux is reflected on the first mirror surface, then to the second mirror surface, and projected so as to scan on the object correspondingly to rotation of the mirror unit. The mirror unit includes multiples pairs of the first and second mirror surfaces, and the respective intersection angles of the multiples pairs are different from each other. In one rotation of the mirror unit, light flux emitted from the light source is reflected on the second mirror surfaces, and is projected sequentially, thereby to scan a measurement range in which the object is measured. Length in a sub scanning direction of the light flux and intersection angles of the multiples pairs correspond to length in a sub scanning direction of the measurement range.