Company Filing History:
Years Active: 2002-2004
Title: Hiroyuki Oi: Innovator in Wafer Bonding Technology
Introduction
Hiroyuki Oi is a prominent inventor based in Tokyo, Japan, known for his contributions to the field of semiconductor technology. With a total of four patents to his name, Oi has made significant advancements in methods and apparatuses for producing bonded dielectric separation wafers.
Latest Patents
Oi's latest patents include a method and apparatus for producing bonded dielectric separation wafers. This invention provides a method for producing a bonded dielectric separation wafer that allows for auto-alignment with reference to the orientation flat of a supporting substrate wafer after the wafer bonding step. The apparatus used for bonding wafers captures transmission images of silicon wafers when they are stacked. By determining the positions of the dielectric isolation grooves and the orientation flat from these images, the bonding position of the wafers can be accurately established. This innovation enables auto-alignment of the bonded dielectric separation wafer post-bonding.
Career Highlights
Throughout his career, Hiroyuki Oi has worked with notable companies such as Mitsubishi Materials Silicon Corporation and Sumitomo Mitsubishi Silicon Corporation. His experience in these organizations has contributed to his expertise in wafer bonding technology and semiconductor manufacturing.
Collaborations
Oi has collaborated with several professionals in his field, including Kazuya Sato and Hiroshi Shimamura. These collaborations have likely enhanced his research and development efforts in semiconductor technologies.
Conclusion
Hiroyuki Oi's innovative work in wafer bonding technology has made a significant impact on the semiconductor industry. His patents reflect a commitment to advancing technology and improving manufacturing processes.