IDiyas

For the Inventor, By the Inventor

Tokyo, Japan

Hiroshi Kajimura

USPTO Granted Patents = 24

Average Co-Inventor Count = 2.3

ph-index = 17

Forward Citations = 740(Granted Patents)


Company Filing History:

goldMedal24 out of 5,729 
 
Olympus Optical Company, Ltd.
 patents

Years Active: 1990-1998

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24 patents (USPTO):
1. 5760300 - Scanning probe microscope (1998-06-02),
2. 5408094 - Atomic force microscope with light beam emission at predetermined angle (1995-04-18),
3. 5394741 - Atomic probe microscope (1995-03-07),
4. 5294804 - Cantilever displacement detection apparatus (1994-03-15),
5. 5294790 - Probe unit for near-field optical scanning microscope (1994-03-15),
6. 5289408 - Memory apparatus using tunnel current techniques (1994-02-22),
7. 5274230 - Scanning probe microscope having first and second optical waveguides (1993-12-28),
8. 5266502 - STM memory medium (1993-11-30),
9. 5260824 - Atomic force microscope (1993-11-09),
10. 5245863 - Atomic probe microscope (1993-09-21),
11. 5231286 - Scanning probe microscope utilizing an optical element in a waveguide (1993-07-27),
12. 5227626 - Lithography apparatus using scanning tunneling microscopy (1993-07-13),
13. 5216254 - Circuit pattern forming apparatus using MU-STM (1993-06-01),
14. 5206702 - Technique for canceling the effect of external vibration on an atomic (1993-04-27),
15. 5166516 - Scanning probe microscope with slant detection and compensation (1992-11-24),

Title: Innovator Spotlight: Hiroshi Kajimura of Tokyo, Japan

Introduction

Hiroshi Kajimura is a prominent inventor based in Tokyo, Japan, known for his groundbreaking contributions to microscopy technologies. With a prolific record of 24 patents, Kajimura has made significant strides in advancing our understanding of materials and biological systems at the microscopic level.

Latest Patents

Among his latest innovations, two noteworthy patents stand out. The first is a **Scanning Probe Microscope**, which features a probing apparatus equipped with an elastic body supported by a support, holding a probe at its free end. This elastic body is immersed in a solution containing the sample under study, and is oscillated at its natural frequency by a driving source. A displacement detecting device captures variations in oscillation as the probe tip approaches the sample surface, feeding the output into a sample data monitor to create a topographic image.

The second is an **Atomic Force Microscope with Light Beam Emission at a Predetermined Angle**. This device consists of a cantilever possessing a probe on one side and a reflection surface on the other. A strategically placed laser diode emits a beam towards the reflection surface at a specific angle. The cantilever is supported by a fixed member connected to a cylindrical actuator that enables scanning of the probe across the sample surface. Additionally, a photodiode is integrated to detect the displacement of the probe through variations in the incident position of the laser beam.

Career Highlights

Hiroshi Kajimura is affiliated with Olympus Optical Company, Ltd., a renowned leader in optical and imaging technologies. His role at the company underscores the vital connection between innovative engineering and practical applications in imaging technologies.

Collaborations

Throughout his career, Kajimura has collaborated with esteemed colleagues Takao Okada and Akitoshi Toda. These partnerships have contributed to the enhancement of research capabilities and the development of cutting-edge microscopy tools that have far-reaching implications in various scientific fields.

Conclusion

Hiroshi Kajimura’s inventive spirit and dedication to advancing microscopy techniques make him a key figure in the world of innovations. With a robust portfolio of patents and impactful collaborations, Kajimura continues to push the boundaries of science and technology, solidifying his position as a leading inventor in his field.

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