This inventor holds 9 USPTO granted patents. Top assignees: Shimadzu Corporation, Mitsubishi Denki Kabushiki Kaisha. Active years: 1996-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 1996-2026
Title: Hiroshi Horikawa: Innovator in Defect Detection Technology
Introduction
Hiroshi Horikawa is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of defect detection technology, holding a total of 9 patents. His innovative work has advanced the capabilities of inspection devices, making them more efficient and effective.
Latest Patents
Among his latest patents is a defect detection device that features an excitation unit to apply vibration to an inspection object. This device includes a vibration state image creation unit that measures the vibration state using optical means, creating various vibration state images based on the measurement results. Additionally, it has an optical image acquisition unit to capture images in the measurement area, along with an image display unit to present these images. The display control unit allows for the simultaneous display of both vibration state images and optical images for the same area, enhancing the inspection process.
Another notable patent is the defect inspection apparatus, which comprises an imager designed to capture images of an inspection target. This apparatus includes a display that shows the captured images and a controller that inspects the target for defects. The controller can superimpose markings on the images, indicating regions of interest, which aids in the defect inspection process.
Career Highlights
Hiroshi Horikawa has worked with esteemed companies such as Shimadzu Corporation and Mitsubishi Electric Corporation. His experience in these organizations has allowed him to develop and refine his innovative technologies in defect detection.
Collaborations
Throughout his career, Horikawa has collaborated with notable colleagues, including Yutaro Kimura and Tetsuhiko Ikeshima. These partnerships have contributed to the advancement of his inventions and the development of new technologies.
Conclusion
Hiroshi Horikawa's contributions to defect detection technology have made a significant impact in the field. His innovative patents and collaborations with industry leaders continue to shape the future of inspection devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile