The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Mar. 21, 2023
Shimadzu Corporation, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A defect detection device includes: an excitation unit configured to apply vibration to an inspection object; a vibration state image creation unit configured to measure by an optical means a vibration state in a measurement area on a surface of the inspection object to which the vibration is applied, and to create one or more types of vibration state images representing the vibration state in the measurement area depending on a result of the measurement; an optical image acquisition unit configured to acquire an optical image in the measurement area; an image display unit configured to display an image; and a display control unit configured to perform control to simultaneously display two images among the one or more types of vibration state images and the optical image for the same area in the measurement area on the image display unit.