The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Sep. 15, 2021
Shimadzu Corporation, Kyoto, JP;
Naoto Mishina, Kyoto, JP;
Hirofumi Okamoto, Kyoto, JP;
Takashi Tanaka, Kyoto, JP;
Satoru Sugimoto, Kyoto, JP;
Masashi Hayakawa, Kyoto, JP;
Takahide Hatahori, Kyoto, JP;
Hiroshi Horikawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A defect inspection apparatus () includes an imager (image sensor) configured to image an inspection target, and a display () configured to display an image based on an image captured by the imager. The defect inspection apparatus () also includes a controller () configured or programmed to receive a setting of a marking () in a predetermined region of interest (S) on the image (still image) displayed on the display (). The controller () is configured or programmed to inspect the inspection target () for a defect based on the image captured by the imager, and superimpose an image of the marking () on a position corresponding to the predetermined region of interest (S) in an image of an inspection result (overlay image) displayed on the display ().