The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Jul. 02, 2020
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Hiroshi Horikawa, Kyoto, JP;
Kenji Takubo, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01B 9/02 (2022.01); G01B 9/02098 (2022.01); G01N 29/04 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01B 9/02095 (2013.01); G01B 9/02098 (2013.01); G01N 29/045 (2013.01); G01N 2021/1765 (2013.01); G01N 2201/06113 (2013.01);
Abstract
This defect inspection apparatus () is provided with an excitation unit (), a laser illumination unit (), an interference unit (), an imaging unit (), a holding member () for holding the imaging unit at a position spaced apart from an inspection target () by a predetermined distance, a connecting member () for connecting the holding member or the imaging unit and the excitation unit, and a controller () for generating an image () related to the propagation of an elastic wave on an inspection target.