Location History:
- Tokyo, JP (2014)
- Kakamigahara, JP (2014)
- Sagamihara, JP (2010 - 2015)
Company Filing History:
Years Active: 2010-2015
Title: Hiromasa Yamanashi: Innovator in Specimen Measurement Technologies
Introduction
Hiromasa Yamanashi is a prominent inventor based in Sagamihara, Japan. He has made significant contributions to the field of specimen measurement technologies, holding a total of 7 patents. His work focuses on enhancing the precision and speed of specimen charge measurement and evaluation methods.
Latest Patents
Yamanashi's latest patents include a specimen potential measuring method and a charged particle beam device. The specimen potential measuring method aims to perform charge measurement or focusing at high speed and precision, even for specimens with mixed fixed and induced charges. This method utilizes a first measuring device located outside the specimen chamber and a second device within the chamber to selectively conduct measurements based on predetermined threshold values.
Another notable patent is the pattern evaluation method, which addresses the displacement of pattern positions between observation images acquired from different directions. This method measures astigmatic differences or focus position displacements at high speed while minimizing the dose. A processing unit calculates the necessary corrections based on beam deflection, ensuring accurate image acquisition.
Career Highlights
Yamanashi is currently employed at Hitachi High-Technologies Corporation, where he continues to innovate in the field of measurement technologies. His work has significantly advanced the capabilities of charged particle beam devices and specimen evaluation methods.
Collaborations
Throughout his career, Yamanashi has collaborated with notable colleagues, including Muneyuki Fukuda and Yasunari Sohda. These collaborations have contributed to the development of cutting-edge technologies in his field.
Conclusion
Hiromasa Yamanashi's contributions to specimen measurement technologies have established him as a key figure in the industry. His innovative patents and ongoing work at Hitachi High-Technologies Corporation continue to push the boundaries of precision measurement.