Nirasaki, Japan

Hiroki Hosaka


Average Co-Inventor Count = 1.8

ph-index = 5

Forward Citations = 54(Granted Patents)


Location History:

  • Yamanashi-ken, JP (1998)
  • Nirasakai, JP (2008)
  • Nirasaki, JP (2006 - 2022)
  • Yamanashi, JP (2018 - 2022)

Company Filing History:


Years Active: 1998-2024

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20 patents (USPTO):Explore Patents

Title: **Innovator Hiroki Hosaka: Advancements in Test Devices and Wafer Inspection**

Introduction

Hiroki Hosaka, an accomplished inventor based in Nirasaki, Japan, has made significant contributions to the fields of testing technologies and semiconductor inspection. With a portfolio of 20 patents, his innovative spirit continues to drive advancements in the industry.

Latest Patents

Amongst his latest patents are groundbreaking inventions such as a test device, change kit, and a method of exchanging the change kit. This invention provides techniques for testing both rectangular and circular substrates. The test device incorporates an exchangeable change kit that consists of a first holding device, designed to hold a rectangular substrate, and a second holding device, meant for a circular substrate. The functionality to interchange these devices according to the substrate type enhances the testing process significantly. Additionally, he has developed a wafer inspection apparatus featuring multiple inspection parts arranged both vertically and horizontally, equipped with air circulating mechanisms to maintain optimal inspection conditions.

Career Highlights

Hiroki Hosaka has built his career at prestigious firms, including Tokyo Electron Limited and Samsung Electronics Co., Ltd. His work at these companies has been pivotal in evolving testing methodologies and semiconductor technologies, marking him as a key player in the industry. His dedication to innovation and quality assurance has allowed him to hold numerous patents that contribute to the advancement of technology.

Collaborations

Throughout his career, Hosaka has collaborated with esteemed professionals such as Shuji Akiyama and Tadashi Obikane. These collaborations have fostered a creative environment for developing cutting-edge technologies, enriching the scope and application of his patents.

Conclusion

Hiroki Hosaka's contributions to innovations in testing devices and wafer inspection exemplify his commitment to pushing the boundaries of technology. With an impressive patent portfolio and collaborative efforts, he continues to shape the future of semiconductor testing solutions. His innovative work is set to impact the industry for years to come.

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