Yokohama, Japan

Hiroaki Hatanaka

USPTO Granted Patents = 9 


 

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 31(Granted Patents)


Location History:

  • Yokohama, JP (2003 - 2012)
  • Tokyo, JP (2017 - 2020)
  • Koto-ku, JP (2018 - 2020)

Company Filing History:


Years Active: 2003-2024

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9 patents (USPTO):Explore Patents

Title: Innovations of Hiroaki Hatanaka

Introduction

Hiroaki Hatanaka is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of damage evaluation and ultrasonic flaw detection, holding a total of nine patents. His work has advanced the methodologies used in inspecting and evaluating the integrity of materials.

Latest Patents

Hatanaka's latest patents include a damage evaluation device and a damage evaluation method. This device features a phased array probe that emits ultrasonic signals from the surface of an inspection metal, detecting reflection signals from within the metal. An arithmetic processor calculates pixel data by quantifying these reflection signals and evaluates the damage based on the scattering degree of the pixel data. Another notable patent is an ultrasonic flaw detection device, which includes a transmission window and a reception window designed to inhibit unwanted ultrasonic waves. This device enhances the accuracy of inspections by focusing on the required inspection range.

Career Highlights

Throughout his career, Hatanaka has worked with notable companies such as IHI Corporation and Ishikawajima-Harima Heavy Industries Co., Ltd. His experience in these organizations has allowed him to develop innovative solutions that address complex engineering challenges.

Collaborations

Hatanaka has collaborated with several professionals in his field, including Akinori Tsuda and Hiroki Kawai. These partnerships have contributed to the advancement of his inventions and the successful implementation of his technologies.

Conclusion

Hiroaki Hatanaka's contributions to the fields of damage evaluation and ultrasonic flaw detection demonstrate his innovative spirit and commitment to engineering excellence. His patents reflect a deep understanding of material integrity and inspection methodologies, making him a significant figure in his industry.

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