The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2024
Filed:
Aug. 03, 2022
Applicant:
Ihi Corporation, Tokyo, JP;
Inventors:
Assignee:
IHI CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/06 (2006.01); G01N 29/26 (2006.01); G01N 33/207 (2019.01);
U.S. Cl.
CPC ...
G01N 29/043 (2013.01); G01N 29/069 (2013.01); G01N 29/26 (2013.01); G01N 33/207 (2019.01); G01N 2291/267 (2013.01);
Abstract
A damage evaluation device includes: a phased array probe that irradiates an ultrasonic signal from a surface of an inspection metal toward an inside of the inspection metal and detects a reflection signal reflected in a predetermined region inside the inspection metal; and an arithmetic processor. The arithmetic processor sets planes parallel to each other in an inspection region, calculates pixel data by quantifying the reflection signal from segments set in each of the planes; calculates a scattering degree of the pixel data, and evaluates damage of the inspection metal based on the scattering degree.