The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2003
Filed:
Apr. 30, 2002
Ishikawajima-Harima Heavy Industries Co., Ltd., Tokyo, JP;
Abstract
In the ultrasonic flaw detection method and apparatus, wideband longitudinal ultrasonic waves are irradiated from an ultrasonic wave generator probe onto a weld portion of a coarse grained material; from the waveforms of flaw detection echoes that are subsequently obtained, the highest frequency component that can be extracted using time frequency analysis is then extracted; subsequent ½ magnification frequency components are then extracted sequentially; waveforms of a necessary plurality of frequency bands from among each of the frequency bands that were extracted and have undergone waveform separation are then multiplied, and waveform peaks that are formed by the multiplication are detected as being defect portion echoes generated by defect portions in the coarse grained material weld portion; and, as a result, information on the defect portion is obtained from the detected defect portion echo.