The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Jul. 18, 2018
Applicant:
Ihi Corporation, Tokyo, JP;
Inventors:
Assignee:
IHI CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/22 (2006.01); G01N 29/26 (2006.01); G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01S 7/527 (2006.01); G01S 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 29/221 (2013.01); G01N 29/04 (2013.01); G01N 29/041 (2013.01); G01N 29/043 (2013.01); G01N 29/24 (2013.01); G01N 29/26 (2013.01); G01S 7/527 (2013.01); G01S 15/02 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/044 (2013.01); G01N 2291/102 (2013.01); G01N 2291/267 (2013.01);
Abstract
Provided is an ultrasonic flaw detection device including: a transmission window; a transmission probe, which is configured to transmit an ultrasonic beam from the transmission window toward a range required to be inspected, which is set in advance, of an inspection surface of an object to be inspected; a reception window, which is arranged in a relationship with respect to the transmission window in which an ultrasonic wave that has been reflected outside the range required to be inspected is inhibited from reaching the reception window; and a reception probe, which is configured to receive an ultrasonic wave that has passed through the reception window.