The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Aug. 15, 2016
Ihi Corporation, Koto-ku, JP;
Hiroki Kawai, Koto-ku, JP;
Akinori Tsuda, Koto-ku, JP;
Hiroaki Hatanaka, Koto-ku, JP;
Yuichi Yamaguchi, Koto-ku, JP;
Koichi Inagaki, Koto-ku, JP;
IHI Corporation, Koto-ku, JP;
Abstract
Provided is a method for inspecting an electroconductive composite material including disposing a detection magnetic field measurement unit, disposing a correction magnetic field measurement unit, applying a current, acquiring a detection magnetic field strength, acquiring a correction magnetic field strength, and detecting a portion in which arrangement of carbon fibers is disordered. The operation includes calculating a correction coefficient using the correction magnetic field strength and correcting the detection magnetic field strength using the correction coefficient.