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Hideo Takeuchi

USPTO Granted Patents = 15

Average Co-Inventor Count = 1.3

ph-index = 4

Forward Citations = 42(Granted Patents)

Location History:

Kazo, JP (1997)
Ebina, JP (2012 - 2013)
Tokyo, JP (1989 - 2014)
Kanagawa, JP (2012 - 2015)

Company Filing History:

7 out of 11,665

Fuji Xerox Co., Ltd.

3 out of 21,351

Mitsubishi Denki Kabushiki Kaisha

Adv Antest Corporation

4. 2 out of 15,906

Mitsubishi Electric Corporation

5. 1 out of 1,328

Yokogawa Electric Corporation

Years Active: 1989-2015

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15 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9083835 - Image reading apparatus, control apparatus and method, and computer readable medium storing program for implementing a power saving technique (2015-07-14),

2. 8699093 - Image reading apparatus and optical unit (2014-04-15),

3. 8610973 - Image reading apparatus and multilayer substrate (2013-12-17),

4. 8559072 - Image reading apparatus and linear light source unit (2013-10-15),

5. 8367997 - Image reading device, computer readable medium, and light amount adjusting method (2013-02-05),

6. 8264750 - Image reading apparatus (2012-09-11),

7. 8237996 - Image reading apparatus, controller, image forming apparatus and angular position controlling method (2012-08-07),

8. 7700972 - Semiconductor device (2010-04-20),

9. 7656514 - Method and apparatus for evaluating semiconductor layers (2010-02-02),

10. 7420684 - Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level (2008-09-02),

11. 7038768 - Optical measuring method for semiconductor multiple layer structures and apparatus therefor (2006-05-02),

12. 6998615 - Method for evaluating piezoelectric fields (2006-02-14),

13. 6683470 - DC testing apparatus and semiconductor testing apparatus (2004-01-27),

14. 5661626 - Excess current detection and control circuit for power source in (1997-08-26),

15. 4860574 - Paramagnetic oxygen analyzer (1989-08-29),

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