Fuji Xerox Co., Ltd.

Mitsubishi Denki Kabushiki Kaisha

Mitsubishi Electric Corporation

Adv Antest Corporation

Yokogawa Electric Corporation

Hideo Takeuchi

Yoshitsugu Yamamoto

Takahide Ishikawa

Masato Maeda

An image reading apparatus used for an image forming apparatus that is coupled therewith and that has a main controller which performs control of the image forming apparatus includes an image reading unit, a detector, and a communication controller. The image reading unit reads an image formed on a document. The detector detects a state of the image reading unit. The communication controller connects to the main controller, the detector, and a communication line. Power is supplied to the detector and the communication controller in both a first operating state, in which supply of power to the main controller is stopped, and a second operating state, in which power is supplied to the main controller. The detector transmits a detection signal to the communication controller in the first operating state, and transmits the detection signal to the main controller in the second operating state.

Image reading apparatus, control apparatus and method, and computer readable medium storing program for implementing a power saving technique

An image reading apparatus includes a body; a circuit board fixed to the body; a light emitter disposed on a first surface of the circuit board, the light emitter emitting light with which a document is irradiated; a light guide disposed opposite the circuit board with the light emitter therebetween, the light emitted from the light emitter passing through the light guide; an urging unit; a supporting unit fixed to the body; and a pressing unit. The pressing unit includes a first portion and a second portion. The first portion is pressed in a direction from the light emitter toward the light guide as a result of receiving a force from the urging unit. The second portion presses the light guide against the light emitter as a result of receiving a reaction force from the supporting unit when the first portion is pressed.

Image reading apparatus and optical unit

An image reading apparatus includes a light source that irradiates a document with light, the light source including a multilayer substrate and light emitting elements linearly arranged on a first surface of the multilayer substrate; and a light receiver that receives reflected light reflected from the document. The multilayer substrate has at least a pair of through holes each having an inner surface on which a reinforcement member is formed, the at least a pair of through holes being formed so that one of the light emitting elements is interposed therebetween. The reinforcement members contact wiring formed on the first surface of the multilayer substrate and wiring formed on a second surface of the multilayer substrate opposite the first surface.

Image reading apparatus and multilayer substrate

An image reading apparatus includes: a light emitting element array that includes plural light emitting elements arranged in line in a first scan direction of a document; a guiding unit that guides light entering from the light emitting element array, and that emits the light toward a reading position of the document while diffusing the light; a light receiving unit that receives reflected light from the reading position irradiated with the light from the light emitting element array through the guiding unit; and a scan unit that moves the reading position of the document in a second scan direction, the reading position being a position read by the light receiving unit.

Image reading apparatus and linear light source unit

An image reading device has: a light source at which plural light-emitting elements are arrayed; a detection unit that detects light amounts of illumination light which are emitted from the light-emitting elements and are reflected by a reference plate; a derivation unit; and an adjustment unit. On the basis of detected light amounts, the derivation unit derives difference amounts between a reference value and average values of light amounts per predetermined first number of adjacent light-emitting elements. On the basis of the derived difference amounts, the adjustment unit adjusts light amounts per the first number of light-emitting elements such that the average values become the reference value.

Image reading device, computer readable medium, and light amount adjusting method

There is provided an image reading apparatus including: a light source with arrayed light emitting elements; a light guide unit that scatters light emitted from the light source such that the light intensity is greater at end portions than at the central portion in the array direction of the light emitting elements, and guides the light to a reading position of a medium to be read; and an optical system that guides the light reflected at the reading position to a light detection unit that detects the light intensity.

Image reading apparatus

The image reading apparatus includes: an original placing unit on which an original is to be placed, and the original placing unit transmitting light applied onto an original surface of the original and light reflected by the original surface; a lighting unit having plural light-emitting elements arrayed in a line and lighting the original surface of the original placed on the original placing unit; an image signal generating unit receiving the light reflected by the original surface lit by the lighting unit and generating an image signal; a detecting unit detecting a position of the original surface; and a lighting-unit setting unit setting, by using a result of the detection by the detecting unit, the lighting unit at an angular position so that the image signal generating unit does not receive light emitted from an optical axis of the light-emitting elements and then reflected by the original surface.

Image reading apparatus, controller, image forming apparatus and angular position controlling method

A semiconductor device comprises an AlN layer, a GaN layer, and an AlGaN layer sequentially formed on a semiconductor substrate. A first opening extends through said GaN layer and said AlGaN layer and exposes part of an upper surface of the AlN layer. A second opening extends through the semiconductor substrate and exposes a part of a lower surface of the AlN layer, in a location facing the first opening. A upper electrode is exposed on an upper surface of the AlN layer in the first opening; and a lower electrode is disposed on a lower surface of the AlN layer in the second opening.

Semiconductor device

A method for evaluating semiconductor layers includes irradiating semiconductor layers on a substrate with light; measuring an optical spectrum peculiar to excitons in the semiconductor layers; and analyzing a broadening factor of optical spectral features of the optical spectrum. The method provides a quick measurement of a surface state of the semiconductor layers with high accuracy.

Method and apparatus for evaluating semiconductor layers

A pump beam irradiates the surface of a semiconductor sample through modulator while irradiating the surface with a probe beam so that a detector measures a light-modulated spectrum of the probe beam reflected from the surface of the semiconductor sample. Then, surface electric field strength is calculated from the period of Franz-Keldysh oscillations appearing in the light-modulated spectrum, and the surface recombination velocity and surface Fermi level are calculated based on a relation between the surface electric field strength and the probe beam power density.

Method and apparatus for measuring surface carrier recombination velocity and surface Fermi level

In a measuring apparatus for a semiconductor multiple layer structure, a spectrometer disperses light from a sample for measurement of the photoluminescence spectrum or disperses probe light to irradiate the sample for the measurement of the reflection spectrum. A controller makes a guide member guide the white light to the spectrometer and acquire electric signals from a first detector for the measurement of the reflection spectrum, and makes the guide member guide the light from the spectrometer to a second detector to acquire electric signals for the measurement of the photoluminescence spectrum.

Optical measuring method for semiconductor multiple layer structures and apparatus therefor

In a method of evaluating a piezoelectric field, non-destructive spectrometry of piezoelectric fields is performed in a semiconductor heterojunction using a technique different from PR spectroscopy. In the method, at first, first and second absorption spectra are measured by irradiating the sample with infrared light at first and second angles, respectively. Then, a peak position of an absorption band having incident-angle dependent intensity is specified, based on the first and second absorption spectra. Thus, the piezoelectric field strength is obtained using a relationship between the piezoelectric field and an electron energy level corresponding to the peak position.

Method for evaluating piezoelectric fields

The apparatus includes: a sequencer for outputting a start signal, a timing signal, a write-in signal, and a clock signal sequentially, when an AD start signal is input; an ADC for measuring an output of a device under test (DUT) to which a test pattern is input, when the start signal is input; an arithmetic/logical unit (ALU) for outputting an output voltage value of the ADC when the timing signal is input, and for outputting a result of comparing the output voltage value with an expected value to the pattern generator as a PASS/FAIL signal; an address counter for updating an address value to be output when the clock signal is input; and a history memory for storing a measurement value in an address indicated by the address value when the write-in signal is input. This configuration makes it possible to measure each voltage value output from the DUT for a test pattern corresponding each AD start signal.

DC testing apparatus and semiconductor testing apparatus

An excess current detection and control circuit for a power source system to provide an overall electric current to a device to be tested, includes: a plurality of device power sources connected in parallel with each other to form the power source system whereby supplying an electric current to the device wherein each of the device power sources is provided with a predetermined excess current level flowing to the device and maintaining the excess current without further increasing the electric current level and generates an excess current detection signal when the electric current reaching the excess current level, a power source condition monitor device connected to the plurality of device power sources for receiving the excess current detection signal from each of the device power sources and generating an interruption signal only when receiving the excess current detection signal from each and all of the device power sources connected to the device to be tested, and a central processor unit for determining whether the overall current flowing through the device under test is larger than a predetermined excess current level of the device under test when receiving the interruption signal from the power source condition monitor device.

Excess current detection and control circuit for power source in

A closed loop-like measuring passage is provided with two openings at symmetrical positions, and a sample gas is introduced through on opening into the passage and discharged therefrom through the other opening. A bypass pipe is connected to the measuring passage midway therealong, and a stable purge gas of known composition is introduced into the pipe from the center thereof. A magnetic field is generated in one of the two connecting portions between the bypass pipe and the measuring passage, and the oxygen gas attracting action of the field results in a change in the ratio of the split of the purge gas stream introduced into the bypass pipe and split into two streams. This change is detected by a pair of purge gas stream detecting sensors provided inside the bypass pipe symmetrically with respect to the portion through which the purge gas is introduced, and the thus detected signals are processed to obtain the difference between them which gives the oxygen gas concentration in the sample gas.

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Tokyo, Japan

Hideo Takeuchi