Henning F Spruth

Title: Henning F. Spruth: Memory-Test and Power-Optimization Innovations.

Introduction

Henning F. Spruth is an inventor based in Austin, Texas. His patent work includes memory-system testing and methods for optimizing power profiles during memory tests. He is associated with Freescale Semiconductor, Inc., and NXP USA, Inc. His portfolio includes 6 patents.

Latest Patents

**Memory System with Redundant Operation.** This invention describes a memory system with a built-in self-test (BIST) circuit that identifies defective storage units. The memory provides data through an output wider than the system’s external data output, while the BIST circuit receives data at the memory’s wider bit width. This arrangement supports testing and redundant operation within the memory system.

**Physical-Aware Power Profile Optimization During Memory Test.** This method organizes test sequences into scheduling buckets that fit within a specified test-time budget. It optimizes the start time of at least one sequence based partly on the physical distance between groups of memories controlled by different BIST controllers. The approach aims to improve the power profile during memory testing.

Career Highlights

Spruth’s listed company affiliations include Freescale Semiconductor, Inc., and NXP USA, Inc. His patent work reflects a focus on memory testing, built-in self-test systems, and power-aware test scheduling.

Collaborations

His listed coworkers include Reinaldo Silveira and Qadeer A. Qureshi, reflecting professional connections in the semiconductor and memory-technology field.

Conclusion

Henning F. Spruth’s inventions address practical challenges in memory testing, including detecting defective storage units and managing power during test execution.