The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Dec. 11, 2013
Applicants:
Henning F. Spruth, Austin, TX (US);
Qadeer A. Qureshi, Dripping Springs, TX (US);
Reinaldo Silveira, Sao Paulo, BR;
Inventors:
Henning F. Spruth, Austin, TX (US);
Qadeer A. Qureshi, Dripping Springs, TX (US);
Reinaldo Silveira, Sao Paulo, BR;
Assignee:
Freescale Semiconductor, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/38 (2006.01); G06F 11/263 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G06F 11/263 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 2029/4402 (2013.01);
Abstract
A memory system includes a memory and a built-in self-test (BIST) unit coupled to the memory. The BIST unit is configured to run a test pattern on the memory to accumulate a fault signature, and store fault signature information based on the accumulated fault signature at multiple locations in the memory.