Company Filing History:
2 out of 113 
1 out of 832,966 Years Active: 1985-2001
Title: The Innovations of Hans-Adolf Gerber
Introduction
Hans-Adolf Gerber is a notable inventor based in Burghausen, Germany. He has made significant contributions to the field of technology, particularly in the areas of surface inspection devices and semiconductor manufacturing. With a total of 3 patents to his name, Gerber's work has had a lasting impact on the industry.
Latest Patents
One of Gerber's latest patents is a standard for calibrating and checking a surface inspection device and the method for its production. This invention relates to a reproducible standard for calibrating and checking the bright-field channel of a surface inspection device used for examining the flat surface of a sample. The method involves producing a microstructure on a substrate surface, which is characterized by being smoothed out.
Another significant patent is focused on the process for the manufacture of semiconductor wafers with a rear side. This innovation allows for the creation of wafers that have a getting action in subsequent oxidation processes through the action of light, particularly laser radiation. By utilizing wafers with a fine surface structure that contains inclined faces, considerable savings in energy and time can be achieved compared to smooth surfaces.
Career Highlights
Throughout his career, Hans-Adolf Gerber has worked with various companies, including Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH. His expertise in the field has allowed him to develop innovative solutions that address complex challenges in technology.
Collaborations
Gerber has collaborated with notable individuals such as Josef Kramler and Franz Kuhn-Kuhnenfeld. These partnerships have contributed to the advancement of his inventions and the overall progress in the industry.
Conclusion
Hans-Adolf Gerber's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to inspire advancements in surface inspection and semiconductor manufacturing.