Location History:
- Hsin-Chu Hsien, TW (2013 - 2014)
- Hsin-Chu County, TW (2020 - 2021)
Company Filing History:
Years Active: 2013-2021
Title: Innovations of Han-Hsing Chen
Introduction
Han-Hsing Chen is a notable inventor based in Hsin-Chu Hsien, Taiwan. He has made significant contributions to the field of sensor package inspection technology. With a total of 6 patents to his name, Chen's work has advanced the methods used in defect detection and inspection processes.
Latest Patents
One of Han-Hsing Chen's latest patents is a defect inspection method for sensor package structures. This method involves using an image capture device to focus on and take pictures of at least three regions of the sensor package structure. The images obtained are aligned along the height direction and exhibit different grayscale values. The method determines the defect image with the maximum grayscale value as a reference and confirms other images based on a predicted grayscale value.
Another significant patent is related to an inspection apparatus that includes a focus assistant loader and a camera assembly. The focus assistant loader is designed with a fetching member and a focus member that has multiple focus portions at different levels. The camera assembly consists of several cameras that focus on these portions to detect tiny defects in tested devices. This innovation enhances the accuracy and efficiency of inspections in sensor package structures.
Career Highlights
Han-Hsing Chen is currently employed at Kingpak Technology Inc., where he continues to develop and refine inspection technologies. His work has been instrumental in improving the reliability of sensor packages used in various applications.
Collaborations
Chen collaborates with talented individuals such as Hsiu-Wen Tu and Chung-Hsien Hsin, contributing to a dynamic team focused on innovation in technology.
Conclusion
Han-Hsing Chen's contributions to sensor package inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the field and provide effective solutions for defect detection.