The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2013

Filed:

Nov. 16, 2010
Applicants:

Hsiu-wen Tu, Hsin-Chu Hsien, TW;

Han-hsing Chen, Hsin-Chu Hsien, TW;

Chung-hsien Hsin, Hsin-Chu Hsien, TW;

Ming-hui Chen, Hsin-Chu Hsien, TW;

Inventors:

Hsiu-Wen Tu, Hsin-Chu Hsien, TW;

Han-Hsing Chen, Hsin-Chu Hsien, TW;

Chung-Hsien Hsin, Hsin-Chu Hsien, TW;

Ming-Hui Chen, Hsin-Chu Hsien, TW;

Assignee:

Kingpak Technology Inc., Chu-Pei, Hsin-Chu Hsien, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0203 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a wafer level image sensor packaging structure and a manufacturing method for the same. The manufacturing method includes the following steps: providing a silicon wafer with image sensor chips, providing a plurality of transparent lids, allotting one said transparent lid on top of the corresponding image sensor chip, and carrying out a packaging process. The manufacturing method of the invention has the advantage of having a simpler process, lower cost, and higher production yield rate. The encapsulation compound arranges on the first surface of the image sensor chip and covers the circumference of the transparent lid to avoid the side light leakage as traditional chip scale package (CSP). Thus, the sensing performance of the wafer level image sensor packaging structure can be enhanced.


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