Guo Qiang Hu

This inventor holds 43 USPTO granted patents and 4 published patent applications, primarily in Image Defect Detection. Top assignee: International Business Machines Corporation. Active years: 2015-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Guo Qiang Hu. Retrieved from https://idiyas.com/inventor/guo-qiang-hu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 43 (Patent Applications = 4)

% Patents Active = 48.8

Average Co-Inventor Count = 5.2

ph-index = 4

Forward Citations = 47(Granted Patents)

Location History:

Beijing, CN (2021)
Shanghai, CN (2015 - 2023)

Company Filing History:

43 out of 166,351

International Business Machines Corporation

patents

Years Active: 2015-2026

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Areas of Expertise:

Image Defect Detection

Neural Networks

Industrial Internet of Things

Object Detection

Machine Learning

Virtual Scene Generation

Defect Localization

Quality Evaluation

Data Transmission

Convolutional Neural Networks

Privacy-Preserving Environment

Template Matching

43 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12718473 - Generating three-dimensional virtual scene (2026-08-25),

2. 12514160 - Locating picking points of anomalies (2026-01-06),

3. 12272046 - Feature detection based on neural networks (2025-04-08),

4. 11842472 - Object defect correction (2023-12-12),

5. 11756185 - Product defect detection (2023-09-12),

6. 11630444 - Artificial Intelligence empowered industrial Internet of Things (2023-04-18),

7. 11574438 - Generating three-dimensional virtual scene (2023-02-07),

8. 11443226 - Training a machine learning model in a distributed privacy-preserving environment (2022-09-13),

9. 11354793 - Object detection with missing annotations in visual inspection (2022-06-07),

10. 11341370 - Classifying images in overlapping groups of images using convolutional neural networks (2022-05-24),

11. 11295439 - Image recovery (2022-04-05),

12. 11205260 - Generating synthetic defect images for new feature combinations (2021-12-21),

13. 11164306 - Visualization of inspection results (2021-11-02),

14. 11158042 - Object defect detection (2021-10-26),

15. 11144578 - High performance and efficient multi-scale trajectory retrieval (2021-10-12),

Title: Innovations by Guo Qiang Hu: A Look into His Patents and Contributions

Introduction: Guo Qiang Hu, a prominent inventor based in Shanghai, China, has made remarkable contributions to the field of image processing and product defect detection. With an impressive portfolio of 40 patents, Hu continues to push the boundaries of technology through innovative solutions.

Latest Patents: Among his latest inventions, Hu has developed methods for object defect correction. In one of his patents, a computing device processes an image of a first object that presents a defect. The device utilizes defect distribution information from various training images to determine the target category of the defect and generate correction notifications. Additionally, Hu has contributed to product defect detection by implementing a computer-implemented method that transforms a template image of a normal product. This method generates geometric training parameters, aligning the template with the image under inspection, thus facilitating accurate identification of defects.

Career Highlights: Guo Qiang Hu is currently associated with International Business Machines Corporation (IBM), a leading technology company. His work at IBM has been pivotal in advancing image processing technologies, contributing to innovation within the organization and the industry at large.

Collaborations: Throughout his career, Hu has collaborated with notable colleagues such as Jian Ding and Peng Ji. These partnerships have fostered a creative environment conducive to the development of new technologies and solutions in the field of defect detection and image processing.

Conclusion: Guo Qiang Hu's dedication to innovation is evident through his patents and collaborative work within IBM. By focusing on object defect correction and product defect detection, he plays a significant role in enhancing technology that benefits various industries. His contributions continue to pave the way for future advancements in image processing and defect identification.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents pending: