The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Nov. 30, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jian Xu, Shanghai, CN;

Guo Qiang Hu, Shanghai, CN;

Yuan Yuan Ding, Shanghai, CN;

Fan Li, Shanghai, CN;

Jinfeng Li, Shanghai, CN;

Jun Zhu, Shanghai, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A01D 46/30 (2006.01); G06F 18/23213 (2023.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 20/10 (2022.01); G06V 20/68 (2022.01);
U.S. Cl.
CPC ...
A01D 46/30 (2013.01); G06F 18/23213 (2023.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06V 20/188 (2022.01); G06T 2210/12 (2013.01); G06V 20/68 (2022.01);
Abstract

A processor may receive an image of the collection of material having a plurality of objects. The processor may identify the anomaly from the plurality of objects. The processor may generate a bounding box for the anomaly. The processor may generate one or more picking points on the anomaly. The one or more picking points may be configured on at least one balance points of the anomaly. The processor may remove the anomaly from the collection of material via the one or more picking points.


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