The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jul. 10, 2019
International Business Machines Corporation, Armonk, NY (US);
Jing Chang Huang, Shanghai, CN;
Guo Qiang Hu, Beijing, CN;
Peng Ji, Shanghai, CN;
Jun Zhu, Shanghai, CN;
Yuan Yuan Ding, Shangahi, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments of the present disclosure relate to object defect detection. In an embodiment, a computer-implemented method is disclosed. According to the method, for a test image of at least one part of a target object, a reference image is generated by repeating a periodic pattern detected in the test image, the target object consisting of elements. A differential image is determined by comparing the test image and the reference image. The differential image is superimposed on a predefined grid image to obtain a superimposed image. The grid image comprises grids corresponding to elements of a reference object associated with the target object. The number of defective elements is determined in the at least one part of the target object based on the superimposed image. In other embodiments, a system and a computer program product are disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile