The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Mar. 31, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jinfeng Li, Beijing, CN;

Guo Qiang Hu, Shanghai, CN;

Jian Xu, Shanghai, CN;

Fan Li, Shanghai, CN;

JingChang Huang, Shanghai, CN;

Jun Zhu, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/00 (2019.01); G06F 18/25 (2023.01); G06F 18/214 (2023.01); G06F 18/2413 (2023.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 18/2148 (2023.01); G06F 18/2413 (2023.01); G06F 18/25 (2023.01); G06N 20/00 (2019.01); G06V 10/764 (2022.01); G06T 2207/20081 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30121 (2013.01); G06T 2207/30141 (2013.01); G06T 2207/30148 (2013.01);
Abstract

According to embodiments of the present invention, a method, a device and a computer program product for image processing is provided. A computing device obtains an image of a first object, the image presenting a defect of the first object. A computing device obtains defect distribution information indicating respective frequencies of a plurality of predetermined categories of defects presented at corresponding locations in a plurality of training images, the plurality of training images presenting second objects and being used for training a defect classifier. A computing device determines a target category of the defect of the first object by applying the image and the defect distribution information to the defect classifier. A computing device generates one or more correction notifications.


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