The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Nov. 21, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jinfeng Li, Beijing, CN;

Guo Qiang Hu, Shanghai, CN;

Fan Li, Shanghai, CN;

Wei Zhao, Shanghai, CN;

Jian Xu, Shanghai, CN;

Jun Zhu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/4609 (2013.01); G06K 9/6256 (2013.01); G06K 2209/19 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Aspects described herein include a computer-implemented method and associated system and computer program product. The method includes training a model using a plurality of defect images. Each defect image corresponds to a respective first feature combination of encoded textual features of a predefined set of textual features. The method further includes generating a first synthetic image using the model. The first synthetic image corresponds to a second feature combination of encoded textual features of the predefined set that is distinct from the first feature combinations.


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