Morgan Hill, CA, United States of America

Greg A Dyck


Average Co-Inventor Count = 5.0

ph-index = 8

Forward Citations = 352(Granted Patents)


Location History:

  • Poughkeepsie, NY (US) (2001 - 2004)
  • Morgan Hill, CA (US) (2006 - 2016)

Company Filing History:


Years Active: 2001-2016

where 'Filed Patents' based on already Granted Patents

23 patents (USPTO):

Title: Innovations by Greg A. Dyck: Advancing I/O Measurement Techniques

Introduction: Greg A. Dyck, an accomplished inventor located in Morgan Hill, California, holds an impressive portfolio of 23 patents. His work primarily focuses on advancements in measurement technologies, particularly in the field of input/output (I/O) operations.

Latest Patents: Among his latest contributions, a significant patent is the "Extended input/output measurement word facility for obtaining measurement data in an emulated environment." This innovation provides a unique facility for emulating I/O measurement, facilitating the storage of measurement data associated with a single I/O operation. The system is designed to store this data in an extended measurement word linked to an I/O response block, achieving a noteworthy resolution of approximately one-half microsecond, which enhances precision in measurement data.

Career Highlights: Greg is currently associated with the International Business Machines Corporation (IBM), where he has made substantial strides in improving I/O measurement technologies. His dedication to innovation is evident through the numerous patents he has secured, reflecting his commitment to addressing complex challenges in the technology landscape.

Collaborations: Throughout his career, Greg has collaborated with talented colleagues, including Leslie W. Wyman and Scott M. Carlson. These partnerships have enriched his work, leading to groundbreaking advancements and helping to shape the future of I/O measurement methodologies.

Conclusion: Greg A. Dyck continues to be a prominent figure in the realm of technology innovation. His extensive patent portfolio and collaborative efforts with industry peers highlight his significant contributions to improving I/O measurement techniques, demonstrating the impact of his work at IBM and beyond.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…