The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2009
Filed:
Dec. 28, 2007
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan LU, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan Lu, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.