The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2009
Filed:
Dec. 28, 2007
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan LU, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
Scott M. Carlson, Tucson, AZ (US);
Greg A. Dyck, Morgan Hill, CA (US);
Tan Lu, Poughkeepsie, NY (US);
Kenneth J. Oakes, Wappingers Falls, NY (US);
Dale F. Riedy, Jr., Poughkeepsie, NY (US);
William J. Rooney, Hopewell Junction, NY (US);
John S. Trotter, Pleasant Valley, NY (US);
Leslie W. Wyman, Poughkeepsie, NY (US);
Harry M. Yudenfriend, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.