The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Jan. 12, 2011
Scott M Carlson, Tucson, AZ (US);
Greg a Dyck, Morgan Hill, CA (US);
Tan LU, Poughkeepsie, NY (US);
Kenneth J Oakes, Poughkeepsie, NY (US);
Dale F Riedy, Jr., Poughkeepsie, NY (US);
William J Rooney, Poughkeepsie, NY (US);
John S Trotter, Poughkeepsie, NY (US);
Leslie W Wyman, Poughkeepsie, NY (US);
Harry M Yudenfriend, Poughkeepsie, NY (US);
Scott M Carlson, Tucson, AZ (US);
Greg A Dyck, Morgan Hill, CA (US);
Tan Lu, Poughkeepsie, NY (US);
Kenneth J Oakes, Poughkeepsie, NY (US);
Dale F Riedy, Jr., Poughkeepsie, NY (US);
William J Rooney, Poughkeepsie, NY (US);
John S Trotter, Poughkeepsie, NY (US);
Leslie W Wyman, Poughkeepsie, NY (US);
Harry M Yudenfriend, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.