Gilad Laredo

Title: The Innovations of Gilad Laredo

Introduction

Gilad Laredo is a prominent inventor based in Haifa, Israel. He has made significant contributions to the field of metrology, particularly in the development of advanced measurement tools. With a total of 10 patents to his name, Laredo's work has had a substantial impact on the industry.

Latest Patents

One of Laredo's latest patents is focused on massive overlay metrology sampling with multiple measurement columns. This innovative multi-column metrology tool includes two or more measurement columns distributed along a column direction. These measurement columns can simultaneously probe multiple measurement regions on a sample that includes metrology targets. Each measurement column is equipped with an illumination sub-system to direct light to the sample, a collection sub-system with a collection lens to gather measurement signals, and a column-positioning sub-system to adjust the position of the collection lens. The measurement region is defined by the field of view of the collection lens and the range of the positioning system in the lateral plane. Additionally, the tool features a sample-positioning sub-system that scans the sample along a different path to position metrology targets within the measurement regions for accurate measurements.

Career Highlights

Throughout his career, Gilad Laredo has worked with notable companies, including Kla Corporation. His expertise in metrology has allowed him to develop cutting-edge technologies that enhance measurement accuracy and efficiency.

Collaborations

Laredo has collaborated with several professionals in his field, including Amnon Manassen and Andrew V Hill. These collaborations have contributed to the advancement of metrology tools and techniques.

Conclusion

Gilad Laredo's innovative work in metrology has led to significant advancements in measurement technology. His contributions continue to influence the industry and pave the way for future innovations.